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Lifetime Inference for Highly Reliable Products Based on Skew-Normal Accelerated Destructive Degradation Test Model
Tsai, Chih-Chun; Lin, Chien-Tai
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[Department of Applied Mathematics and Data Science] Journal Article IEEE Transactions on Reliability 64(4), pp.1340-1355
pi-
rameter as obtained in Table I, i.e.,
(17)
Then, from (7), we obtain the true
product as . Next, given
(13), we find th percentile
9937.
Formation of high-quality photonic nanojets by decorating spider silk 
C. B. Lin; Zih-Huan Huang; Cheng-Yang Liu
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2019-02
[Graduate Institute & Department of Mechanical and Electro-Mechanical Engineering] Journal Article Optics Letters 44(3), p.667-670
. Express 25, 15079 (2017).
B. Luk'yanchuk, R. Paniagua-Domínguez, I. Minin, O. Minin, and Z.
Wang, Opt. Mater. Express 7, 1820 (2017).
Z. Wang, W. Guo
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