101.  First Movers or Latecomers? Monitoring and Development Of Core Technology Capability For Solar Thin-Film Technology Vendors: The Perspective Of Patent Statistics

Lin, Chien-Yu; Chen, Hsueh-Chen; Chang, Horng-Jinh; Shen, Hsin-Ling; Lai, Kuei-Kuei ,  2018-08-25
[管理科學學系暨研究所] 期刊論文
IMMS 2018 ACM conference proceedings, p.139-143
Lin, Chien-Yu Chen, Hsueh-Chen Chang, Horng-Jinh Shen, Hsin-Ling Lai, Kuei-Kuei First Movers or Latecomers? Monitoring and Development Of Core

102.  Generalizations of a Weighted Trapezoidal Inequality for Monotonic Functions and Applications

Tseng, Kuei-lin; Yang, Gou-sheng; 楊國勝; Dragomir, Sever S. ,  2007-04-01
[應用數學與數據科學學系] 期刊論文
ANZIAM J. 48, pp.553-566
Downloaded from https://www.cambridge.org/core. Tamkang University, on 06 Dec 2019 at 56:32:29, subject te the Cambridge Core terms of ose, aveilable

103.  Role of Interfacial Defects in Photoelectrochemical Properties of BiVO4 Coated on ZnO Nanodendrites: X-ray Spectroscopic and Microscopic Investigation

A. R. Shelke; H. T. Wang; J. W. Chiou; K. H. Chen; S. A. Teng; I. A. Lin; C. C. Lee; H. C. Hsueh; Y. H. Liang; C. H. Du; P. L. Yadav; S. C. Ray; S. H. Hsieh; C.W. PaoWang; Hsiao-Tsu; Chiou, Jau-Wern; Chen, Kuan-Hung; Shelke , Abhijeet R.; Dong, Chung-Li; Lai, Chun-Hao; Yeh, Ping-Hung; Du, Chao-Hung; Lai, Chun-Yen; Asokan, Kandasami; Hsieh, Shang-Hsien; Shiu, Hung Wei; Pao, Chih-Wen; Tsai , Huang-Ming; Yang, Jih-Sheng; Wu, Jih-Jen; Ohigashi, Takuji; Pong, Way-Faung ,  2021-08-26
[應用科學博士班] 期刊論文
ACS Applied Materials & Interfaces 13(35), p.41524–41536
Chemical Society core−shell BVO/ZnO heterojunction;photoelectrochemical properties;band gap;interfacial defects;X-ray absorption spectroscopy;scanning

104.  近θ狀態合成奈米核殼高分子粒子的研究

邱奕傑; Chiu, Yi-chieh ,  2017
[化學工程與材料工程學系暨研究所] 學位論文
淡江大學化學工程與材料工程學系碩士班 林達鎔; Lin, Dar-Jong 邱奕傑 Chiu, Yi-chieh 近θ狀態合成奈米核殼高分子粒子的研究 Study on near θ-state synthesis of nano-particulate core-shell polymer

105.  On the dead-core rates for a parabolic equation with strong absorption

郭忠勝 ,  2013-12
[應用數學與數據科學學系] 期刊論文
Bulletin of the Institute of Mathematics, Academia Sinica (New Series) 8, pp.431-444
數學學系暨研究所 郭忠勝 Jong-Shenq Guo On the dead-core rates for a parabolic equation with strong absorption 2013-12 en_US Bulletin of the Institute

106.  Single-particle excitation of core states in epitaxial silicene

Lee, Chi-Cheng; Yoshinobu, Jun; Mukai, Kozo; Yoshimoto, Shinya; Ueda, Hiroaki; Friedlein, Rainer; Fleurence, Antoine; Yukiko, Yamada-Takamura; Ozaki, Taisuke ,  2017-03-28
[物理學系暨研究所] 期刊論文
Phys. Rev. B 95(11), p.115437
, Taisuke Single-particle excitation of core states in epitaxial silicene Recent studies of core-level x-ray photoelectron spectroscopy (XPS) spectra

107.  Influence of Membrane Layer Properties on the Electrophoretic Behavior of a Soft Particle

Liu, Kuan-Liang; Hsu, Jyh-Ping; Tseng, Shiojenn ,  2011-11-01
[應用數學與數據科學學系] 期刊論文
Electrophoresis 32(21), pp.3053-3061
properties of the membrane layer of a soft particle, which comprises a rigid core and a porous membrane layer, on its electrophoretic behavior, is investigated

108.  Optimal Test Access Mechanism (TAM) for Reducing Test Application Time of Core-Based SOCs

Rau, Jiann-Chyi; Wu, Po-han; Huang, Wnag-Tiao; Chien, Chih-Lung; Chen, Chien-Shiun ,  2010-09-01
[電機工程學系暨研究所] 期刊論文
淡江理工學刊=Tamkang Journal of Science and Engineering 13(3)，頁305-314
) for Reducing Test Application Time of Core-Based SOCs 臺北縣：淡江大學 Test Access Mechanism(TAM); Test Application Time; Core-Based SOCs In this paper, we propose

109.  Transmission electron microscopic microstructure of base-metal-electroded BaTiO3 capacitor materials with duplex structures

Chen, Cheng-sao; Chou, Chen-chia; Yang, Wei-chun; Hu, Chen-ti; 林諭男; Lin, I-nan ,  2004-01-15
[物理學系暨研究所] 期刊論文
Japanese journal of applied physics 43 pt.1(1), pp.226-231
-electroded BaTiO3 capacitor materials with duplex structures Japan Society of Applied Physics Microstructures of core-shell or duplex-structured BaTiO3

110.  Reconfigurable multiple scan-chains for reducing test application time of SOCs

簡志龍; Chien, Chih-lung ,  2005
[電機工程學系暨研究所] 學位論文
IP或整合者自行加入的電路單元，接稱為一個core。Test-Access-Mechanism(TAM)是將測試向量(Test Vectors)以及控制訊號(control signals)經由SOC pins傳送至內嵌的cores，並將測試結果(response)輸出至SOC pins。目前在TAM