資料載入中.....
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結果 431-440 / 30503.
431.
A novel reseeding mechanism for pseudo-random testing of VLSI circuits
何應甫; Ho, Ying-fu
,
2005
[電機工程學系暨研究所] 學位論文 ] V. D. Agrawal, R. Dauer, S. K. Jain, H. A. Kalvonjian, C. F. Lee, K. B. McGregor, M. A. Pashan, C. E. Stroud, and L.-C. Suen, BIST at Your Gingertips
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