淡江大學機構典藏:搜尋結果
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 64185/96959 (66%)
造訪人次 : 11771106      線上人數 : 9628
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋

    類別瀏覽

    正在載入社群分類, 請稍候....

    作者瀏覽

    正在載入作者分類, 請稍候...

    年代瀏覽

    正在載入年代分類, 請稍候....

    結果 2581-2590 / 16528.

    上一頁250 251 252 253 254 255 256 257 258 259 260 261 262 263 264 265 266 267 268 下一頁    每頁顯示[10|25|50]項目
    [ 只搜尋有全文項目| 搜尋所有項目]     排序欄位 順序

    2581Statistical inference for a lognormal step-stress model with Type-I censoring

    Lin, Chien-tai; Chou, Cheng-chieh2012-06
    [應用數學與數據科學學系] 期刊論文
    IEEE Transactions on Reliability 61(2), p.361-377
    10.1109/TR.2012.2194178 , NOTATION number of stress levels time to change stress, stress level, number of failures that occur at stress

    2582Student teachers’ perception of the VBL system to enhance technology integration competencies

    張雅芳2013-01-01
    [師資培育中心] 期刊論文
    Communications in Computer and Information Science, 302, 135-149.
    an authentic and complucatod situation thu first time. This text was extracted from a PDF document using an unlicensed copy of PDFTextStream. Some

    2583Statistical inference for a lognormal step-stress model with Type-I censoring

    林千代2012-12-08
    [應用數學與數據科學學系] 會議論文
    中國統計學社101年社員大會暨統計學術研討會
    10.1109/TR.2012.2194178 , NOTATION number of stress levels time to change stress, stress level, number of failures that occur at stress

    2584Planning progressive type-I interval censoring life tests with competing risks

    Shuo-Jye Wu; Syuan-Rong Huang2014-06-01
    [統計學系暨研究所] 期刊論文
    IEEE Transactions on Reliability 63(2), pp.511-522
    . ABBREVIATION MLE maximum likelihood estimate(or) TET total experimental time NOTATION failure time of the -th unit

    2585To use or not to use? Compulsive behavior and its role in smartphone addiction

    Y-H Lin; Y-C Lin; 2017-02-14
    [電機工程學系暨研究所] 期刊論文
    Translational Psychiatry 7(2), e1030(6 pages)
    compulsive behavior `although using smartphone has brought negative consequence, the amount of time spent on smartphone remains unreduced'.1,12–14

    2586Oxidation of methyl methacrylate from semiconductor wastewater by O3 and O3/UV processes

    Shang, Neng-chou; Chen, Yi-hung; 2007-08
    [土木工程學系暨研究所] 期刊論文
    Journal of Hazardous Materials 147(1-2), pp.307-312
    intermediates within 30 min reaction time. To increase the applied ozone dosage can significantly raise the removal efficiency of MMA. However

    2587Improvement of Speeded-Up Robust Features for Robot Visual Simultaneous Localization and Mapping

    Yin-Tien Wang; Guan-Yu Lin2014-07-01
    [機械與機電工程學系暨研究所] 期刊論文
    Robotica 32(4), pp.533-549.
    and mapping (SLAM) system. The image features require high repeatability and unique descriptions to ensure successful detection at each time step

    2588Application of A Time-Domain Fuzzy Logic Controller for Dynamic Positioning of Floating Structures

    Tzung-hang Lee, Yen-Mi Lin2002-09
    [機械與機電工程學系暨研究所] 期刊論文
    Tamkang Journal of Science and Engineering, Vol. 5, NO. 3, pp.137-150
    淡江大學機械與機電工程學系 Tzung-hang Lee, Yen-Mi Lin Tzung-hang Lee Application of A Time-Domain Fuzzy Logic Controller for Dynamic Positioning of Floating

    2589Two-stage maximum likelihood estimation procedure for parallel constant-stress accelerated degradation tests.

    Wu, Cheng-Hsun; Tsai, Tzong-Ru; 2021-02-26
    [統計學系暨研究所] 期刊論文
    IEEE Transactions on Reliability 70(2), p.446-458
    accelerated degradation test;time-transformed model;two-stage estimation; Wiener process. Abstract—The parallel constant-stress accelerated degradation test

    2590A new method for calculating loss coefficients [of power systems]

    Chang, Yung-chung; 楊維楨; 1994-08-01
    [管理科學學系暨研究所] 期刊論文
    IEEE transactions on power systems 9(3), pp.1665-1671
    the incremental lossesfrom Bu =loss coefficients the Bcoefficients is still widely used for real-time economic dispatch LJ


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋