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    "Chang, Pei-zen"的相关文件  

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    类别 日期 题名 作者 档案
    [化學學系暨研究所] 專利 2004-11-16 一種破壞病毒致病性之化學原料 林世明; Lin, Shi-ming; 李世光; Lee, chih-kung; 李世元; Lee, Aadam Sshih-yuan; 朱淑芳; Chu, Shu-fang; 蕭文欣; Hsiao, Wen-hsin; 陳志傑; Chin-Chieh chen; 王安邦; Wang, An-bang; 高全良; Kao, Chuan-liang; 林啓萬; Lin, Chii-wann; 蘇慶琅; Su, Ching-larng; 董育蕙; Ddong, Yu-huei; 張光男; Chang, Kuang-nan; 黃榮山; Huang, Ong-sun; 張培仁; Chang, Pei-zen; 吳文中; Wu, Wen-jong; 陳家智; Chen, Cchia-chih; 徐明璋; Hsu, Ming-chang; 許世明; Hsu, Su-ming; 洪錦堂; Horng, Jim-tong
    [機械與機電工程學系暨研究所] 專利 2003-12-09 Sensor system of surface plasmon resonance (SPR) and measuring method thereof 林啟萬; Lin, Chu-wann; Huang, Chi-yu; Chiu, Jyh-perng; Liou, Ying-tsuen; Shiue, Shuen-chen; Kuo, Te-son; Huang, Long-sun; Chang, Pei-zen; 楊龍杰; Yang, Lung-jieh; Wu, Chau-chung; Lin, Shiming; Lee, Chih-kung
    [機械與機電工程學系暨研究所] 專利 2002-05-22 Sensor system of surface plasmon resonance (SPR) and measuring method 林啟萬; Lin, Chu-wann; 楊龍杰; Yang, Lung-jieh; Huang, Chi-yu; Chiu, Jyh-perng; Liou, Ying-tsuen; Shiue, Shuen-chen; Kuo, Te-son; Huang, Long-sun; Chang, Pei-zen; Wu, Chau-chung; Lin, Shi-ming; Lee, Chih-kung
    [機械與機電工程學系暨研究所] 會議論文 2003-05-04 In-situ monitoring of thickness of quartz membrane during batch chemical etching using a novel micromachined acoustic wave sensor Lee, Chi-yuan; Lee, Chi-yuan; Wu, Tsung-tsong; Chen, Yung-yu; Pao, Shih-yung; Chen, Wen-jong; Cheng, Ying-chou; Chang, Pei-zen; Chen, Ping-hei; Lee, Chih-kung; Dai, Ching-liang; 楊龍杰; Yang, Lung-jieh; Yen, Kaih-siang; Xiao, Fu-yuan; Liu, Chih-wei; Lu, Shui-shong
    [機械與機電工程學系暨研究所] 期刊論文 2005-03 A piezoresistive micro pressure sensor fabricated by commercial DPDM CMOS process 楊龍杰; Yang, Lung-jieh; Lai, Chen-chun; Dai,Ching-liang; Chang, Pei-zen
    [機械與機電工程學系暨研究所] 期刊論文 2004-06 Special issue on micro system technology 張培仁; Chang, Pei-zen; 楊龍杰; Yang, Lung-jieh
    [機械與機電工程學系暨研究所] 期刊論文 2001-05-01 CMOS microelectromechanical bandpass filters 楊龍杰; Yang, Lung-jieh; Huang, Tsung-wei; Chang, Pei-zen
    [機械與機電工程學系暨研究所] 期刊論文 1998-09 A method using V-grooves to monitor the thickness of silicon membrane with m resolution Chang, Pei-zen; 楊龍杰; Yang, Lung-jieh

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