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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/98801


    Title: Optimal decisions on the accelerated degradation test plan under the Wiener Process
    Authors: Tsai, Tzong-Ru;Lio, Yuh-Long;Jiang, N
    Contributors: 統計學系暨研究所
    Date: 2014
    Issue Date: 2014-09-22 09:51:14 (UTC+8)
    Abstract: The cumulative damage of highly reliable products that subject to multiple loading stresses is investigated under Wiener process. Optimal strategies on the constant-stress accelerated degradation test plan are established to reach a compromised decision between the experiment budget and the estimation precision on the reliability inference. An algorithm is provided to search an optimal strategy for the accelerated degradation test. An example of light emitting diodes is used for illustrating the application of the proposed method.
    Relation: Quality Technology and Qualitative Management 11(4), pp.461-470
    DOI: 10.1080/16843703.2014.11673357
    Appears in Collections:[統計學系暨研究所] 期刊論文

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