English  |  正體中文  |  简体中文  |  Items with full text/Total items : 52310/87426 (60%)
Visitors : 9084326      Online Users : 331
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/98418

    Title: Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes
    Authors: Tsai, Chih-chun;Lin, Chien-tai
    Contributors: 淡江大學數學學系
    Keywords: Degradation data;Gamma process;Optimal test plan;Reliability;Selection rule
    Date: 2014-05-06
    Issue Date: 2014-07-31 17:11:38 (UTC+8)
    Publisher: Philadelphia: Taylor & Francis Inc.
    Abstract: Manufacturers are often faced with the problem of how to select the most reliable design among several competing designs in the stage of development.It becomes complicated if products are highly reliable. Under the circumstances, recent work has focused on the study with degradation data by assuming that degradation paths follow Wiener processes or random-effect models. However, it is more appropriate to use gamma processes to model degradation data with monotone-increasing pattern. This article deals with the selection problem for such processes. With a minimum probability of correct decision, optimal test plans can be obtained by minimizing the total cost.
    Relation: Communications in Statistics-Theory and Methods 43(10-12), pp.2419-2428
    DOI: 10.1080/03610926.2013.804562
    Appears in Collections:[數學學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    Optimal Selection of the Most Reliable Design Based on Gamma Degradation Processes.pdf558KbAdobe PDF0View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback