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    Title: Effect of Intermediate Annealing on the Structural, Electrical and Dielectric Properties of Zinc Ferrite: An XANES Investigation
    Authors: Singh, Jitendra Pal;Chen, C. L.;Dong, C. L.;Srivastava, R. C.;Agrawal, H. M.;Pong, W. F.;Asokan, K.
    Contributors: 淡江大學物理學系
    Keywords: DIELECTRIC CONSTANT;INTERMEDIATE ANNEALING;X-RAY ABSORPTION SPECTROSCOPY;ZINC FERRITE
    Date: 2013-02
    Issue Date: 2014-07-31 15:30:23 (UTC+8)
    Publisher: Valencia: American Scientific Publishers
    Abstract: In present work we have studied the effect of intermediate annealing (300, 500, 800 and 1000 °C) on the structural, electrical and dielectric properties of zinc ferrite synthesized by a nitrate route. Although structural properties as observed by X-ray diffraction and Raman spectroscopy do not exhibit any change with intermediate annealing, however the dielectric constant as a function of frequency and electrical resistivity as a function of temperature exhibit quiet different behavior for the sample annealed at 1000 °C. Higher resistivity of this sample is due to stronger localization of states at conduction and increase in hole states.
    Relation: Science of Advanced Materials 5(2), pp.171-181
    DOI: 10.1166/sam.2013.1444
    Appears in Collections:[物理學系暨研究所] 期刊論文

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