English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 52343/87441 (60%)
造訪人次 : 9112561      線上人數 : 176
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/98318


    題名: A study of quality management strategy for reused products
    作者: Lo, Hui-Chiung;Yu, Rouh-Yun
    貢獻者: 淡江大學企業管理學系
    關鍵詞: Upgrade threshold value;Warranty length;Used product;Extended producer responsibility (EPR)
    日期: 2013-11-01
    上傳時間: 2014-07-15 17:00:35 (UTC+8)
    出版者: Cambridge: Elsevier
    摘要: To ensure the sustainability, industries have to move forward to product recovery strategies. Reuse is one of the most efficient strategies as it preserves natural resources while maintaining the functional properties of the product. To alleviate the concerns over the quality at the end of first life, laws are enacted to protect the consumers through mandatory warranty requirements. Offering warranty results in additional costs, this cost might be reduced through upgrade that improves the reliability of the item. Considering the age at the end of first life as stochastic, this paper proposes a profit model, relevant costs like upgrade and the minimal repair during the warranty period are included. Optimal upgrade level and warranty length are jointly derived so that the expected profit per used item for the producer can be maximized. Algorithm to search for the optimal solution is developed for a special case. Numerical examples are utilized to demonstrate the feasibility of the proposed approach and the sensitivity analyses regarding the important parameters that might impact the profit.
    關聯: Reliability Engineering and System Safety 119, pp.172-177
    DOI: 10.1016/j.ress.2013.05.009
    顯示於類別:[企業管理學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML140檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋