淡江大學機構典藏:Item 987654321/98263
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 62805/95882 (66%)
造访人次 : 3937859      在线人数 : 882
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/98263


    题名: A New Measure of Cluster Validity Using Line Symmetry
    作者: Chou, Chien-Hsing;Hsieh, Yi-Zeng;Su, Mu-Chun
    贡献者: 淡江大學電機工程學系
    关键词: cluster validity;clustering algorithm;line symmetry;cluster analysis;similarity measure;unsupervised learning
    日期: 2014-02
    上传时间: 2014-06-27 23:49:50 (UTC+8)
    出版者: Taipei: Institute of Information Science
    摘要: Many real-world and man-made objects are symmetry, therefore, it is reasonable to assume that some kind of symmetry may exist in data clusters. In this paper a new cluster validity measure which adopts a non-metric distance measure based on the idea of "line symmetry" is presented. The proposed validity measure can be applied in finding the number of clusters of different geometrical structures. Several data sets are used to illustrate the performance of the proposed measure.
    關聯: Journal of Information Science and Engineering 30(2), pp.443-461
    显示于类别:[電機工程學系暨研究所] 期刊論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    A New Measure of Cluster Validity Using Line Symmetry.pdfA New Measure of Cluster Validity Using Line Symmetry448KbAdobe PDF404检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈