淡江大學機構典藏:Item 987654321/98251
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 59600/92934 (64%)
造访人次 : 821514      在线人数 : 42
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/98251


    题名: Substrate and BMT Inter Layer Effect on Pulsed Laser Deposited Barium Strontium Titanate Thin Films and Its Microwave Properties
    作者: Joseph, P.T.;Chu, Ying-Hao;Chen, Yi Chun;Cheng, Hsiu Fung;Lin, I-Nan
    贡献者: 淡江大學物理學系
    关键词: (Ba,Sr)TiO3;Ba(Mg1/3Ta2/3)O3;Microwave;Lattice parameter
    日期: 2004-11
    上传时间: 2014-06-24 10:00:36 (UTC+8)
    出版者: Hsinchu, Taiwan : Chinese Society for Material Science
    摘要: We have deposited epitaxial Ba0.4Sr0.6TiO3 (BST) thin films via laser ablation on to SiO2 and Pt(Si) substrates with or without a Ba(Mg1/3Ta2/3)O3 (BMT) buffer layer. The structure and microwave dielectric properties of the films have been investigated with two different substrates and a BMT buffer layer. We have found that BMT buffer layer enhances the crystalline growth behavior and also effects dielectric properties of the BST film. The incorporation of BMT buffer layer engenders a change in the lattice parameter BST of the order of 0.01277 on SiO2 substrates and 0.01189 on Pt-Si Substrates. The evanescent microprobe (EMP) analysis reveals the close relation in the variation of microwave property of the deposited films allied with the variation in lattice parameter and the grain size/shape.
    關聯: 中國材料科學學會:2004CSMS論文集=Proceedings: the 2004 Annual Conference of the Chinese Society for Material Science, 3p.
    显示于类别:[物理學系暨研究所] 會議論文

    文件中的档案:

    档案 大小格式浏览次数
    index.html0KbHTML281检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈