English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 49378/84106 (59%)
造訪人次 : 7369248      線上人數 : 52
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/97941

    題名: Monitoring general linear profiles using simultaneous confidence sets schemes
    作者: Huwang, Longcheen;Wang, Yi-Hua Tina;Xue, Shuhan;Zou, Changliang
    貢獻者: 淡江大學統計學系
    關鍵詞: Profile monitoring;Simultaneous confidence sets;EWMA;Average run length;Change point estimation;Phase II study
    日期: 2014-02
    上傳時間: 2014-05-07 15:04:54 (UTC+8)
    出版者: Pergamon Press
    摘要: In this article we consider the quality of a process which can be characterized by a general linear profile. For monitoring the general linear profile, we mimic the charting scheme for the distribution of a univariate quality characteristic by using two individual charts for the mean and variance of the profile, respectively. For monitoring the mean of the profile, based on the concept of simultaneous confidence set we propose a novel exponentially weighted moving average (EWMA) chart, which takes the features of the entire profile into account. Then this chart is used together with an EWMA chart for the variance of the profile to monitor the whole profile. Simulation studies show the effectiveness and efficiency of the proposed monitoring scheme. Furthermore, a systematic diagnostic method in the literature is utilized to find the change point location and to identify the parameters of change in the process. Finally, we use an example from semiconductor manufacturing industry to demonstrate the implementation of the proposed monitoring scheme and diagnostic method.
    關聯: Computers & Industrial Engineering 68, pp.1-12
    DOI: 10.1016/j.cie.2013.11.014
    顯示於類別:[統計學系暨研究所] 期刊論文


    檔案 描述 大小格式瀏覽次數
    2014 compoter&industrial simultaneous band.pdf662KbAdobe PDF414檢視/開啟



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋