淡江大學機構典藏:Item 987654321/97940
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 62822/95882 (66%)
造访人次 : 4027588      在线人数 : 1224
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/97940


    题名: Monitoring General Linear Profiles When Random Errors Have Contaminated Normal Distributions
    作者: Huwang, Longcheen;Wang, Yi-Hua Tina;Shena, Cheng-Che
    贡献者: 淡江大學統計學系
    关键词: trimmed least squares estimation;average run length;control chart;EWMA;out-of-control;Phase I;Phase II
    日期: 2014-12
    上传时间: 2014-05-07 14:55:18 (UTC+8)
    出版者: Engineering International John Wiley & Sons Ltd.
    摘要: We consider the quality of a process which can be characterized by a general linear profile where the random error has a contaminated normal distribution. On the basis of trimmed least squares estimation, new control charts for monitoring the coefficient parameters and/or the error variance of the profile are proposed. Simulation studies show that the proposed control charts outperform the existing competitors under such a profile. An example from manufacturing facility is used to illustrate the applicability of the proposed charts.
    關聯: Quality and Reliability Engineering International 30(8), pp.1131–1144
    DOI: 10.1002/qre.1536
    显示于类别:[統計學系暨研究所] 期刊論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    10.1002-QREI caomtainming .pdf657KbAdobe PDF546检视/开启
    index.html0KbHTML192检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈