English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 49378/84106 (59%)
造訪人次 : 7364744      線上人數 : 66
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/97940


    題名: Monitoring General Linear Profiles When Random Errors Have Contaminated Normal Distributions
    作者: Huwang, Longcheen;Wang, Yi-Hua Tina;Shena, Cheng-Che
    貢獻者: 淡江大學統計學系
    關鍵詞: trimmed least squares estimation;average run length;control chart;EWMA;out-of-control;Phase I;Phase II
    日期: 2013
    上傳時間: 2014-05-07 14:55:18 (UTC+8)
    出版者: Engineering International John Wiley & Sons Ltd.
    摘要: We consider the quality of a process which can be characterized by a general linear profile where the random error has a contaminated normal distribution. On the basis of trimmed least squares estimation, new control charts for monitoring the coefficient parameters and/or the error variance of the profile are proposed. Simulation studies show that the proposed control charts outperform the existing competitors under such a profile. An example from manufacturing facility is used to illustrate the applicability of the proposed charts.
    關聯: Quality and Reliability Engineering International 30(8), pp.1131–1144
    DOI: 10.1002/qre.1536
    顯示於類別:[統計學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    10.1002-QREI caomtainming .pdf657KbAdobe PDF438檢視/開啟
    index.html0KbHTML96檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋