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    Title: Monitoring General Linear Profiles When Random Errors Have Contaminated Normal Distributions
    Authors: Huwang, Longcheen;Wang, Yi-Hua Tina;Shena, Cheng-Che
    Contributors: 淡江大學統計學系
    Keywords: trimmed least squares estimation;average run length;control chart;EWMA;out-of-control;Phase I;Phase II
    Date: 2014-12
    Issue Date: 2014-05-07 14:55:18 (UTC+8)
    Publisher: Engineering International John Wiley & Sons Ltd.
    Abstract: We consider the quality of a process which can be characterized by a general linear profile where the random error has a contaminated normal distribution. On the basis of trimmed least squares estimation, new control charts for monitoring the coefficient parameters and/or the error variance of the profile are proposed. Simulation studies show that the proposed control charts outperform the existing competitors under such a profile. An example from manufacturing facility is used to illustrate the applicability of the proposed charts.
    Relation: Quality and Reliability Engineering International 30(8), pp.1131–1144
    DOI: 10.1002/qre.1536
    Appears in Collections:[統計學系暨研究所] 期刊論文

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