Planning step-stress test under Type-I censoring for the exponential case

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Title:	Planning step-stress test under Type-I censoring for the exponential case
Authors:	Lin, Chien-Tai;Chou, Cheng-Chieh;N. Balakrishnan
Contributors:	淡江大學數學學系
Keywords:	accelerated life;censored data;distributed computations;maximum likelihood;optimization;reliability
Date:	2014-04-01
Issue Date:	2014-04-22 13:09:35 (UTC+8)
Publisher:	Abingdon: Taylor & Francis
Abstract:	We consider in this work a k-level step-stress accelerated life-test (ALT) experiment with unequal duration steps τ=(τ1, …, τk). Censoring is allowed only at the change-stress point in the final stage. An exponential failure time distribution with mean life that is a log-linear function of stress, along with a cumulative exposure model, is considered as the working model. The problem of choosing the optimal τ is addressed using the variance-optimality criterion. Under this setting, we then show that the optimal k-level step-stress ALT model with unequal duration steps reduces just to a 2-level step-stress ALT model.
Relation:	Journal of Statistical Computation and Simulation 84(4), pp.819-832
DOI:	10.1080/00949655.2012.729313
Appears in Collections:	[Graduate Institute & Department of Mathematics] Journal Article

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