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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/97814


    Title: Planning step-stress test under Type-I censoring for the exponential case
    Authors: Lin, Chien-Tai;Chou, Cheng-Chieh;N. Balakrishnan
    Contributors: 淡江大學數學學系
    Keywords: accelerated life;censored data;distributed computations;maximum likelihood;optimization;reliability
    Date: 2014-04-01
    Issue Date: 2014-04-22 13:09:35 (UTC+8)
    Publisher: Abingdon: Taylor & Francis
    Abstract: We consider in this work a k-level step-stress accelerated life-test (ALT) experiment with unequal duration steps τ=(τ1, …, τk). Censoring is allowed only at the change-stress point in the final stage. An exponential failure time distribution with mean life that is a log-linear function of stress, along with a cumulative exposure model, is considered as the working model. The problem of choosing the optimal τ is addressed using the variance-optimality criterion. Under this setting, we then show that the optimal k-level step-stress ALT model with unequal duration steps reduces just to a 2-level step-stress ALT model.
    Relation: Journal of Statistical Computation and Simulation 84(4), pp.819-832
    DOI: 10.1080/00949655.2012.729313
    Appears in Collections:[數學學系暨研究所] 期刊論文

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