English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 55184/89457 (62%)
造訪人次 : 10678337      線上人數 : 19
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/97814


    題名: Planning step-stress test under Type-I censoring for the exponential case
    作者: Lin, Chien-Tai;Chou, Cheng-Chieh;N. Balakrishnan
    貢獻者: 淡江大學數學學系
    關鍵詞: accelerated life;censored data;distributed computations;maximum likelihood;optimization;reliability
    日期: 2014-04-01
    上傳時間: 2014-04-22 13:09:35 (UTC+8)
    出版者: Abingdon: Taylor & Francis
    摘要: We consider in this work a k-level step-stress accelerated life-test (ALT) experiment with unequal duration steps τ=(τ1, …, τk). Censoring is allowed only at the change-stress point in the final stage. An exponential failure time distribution with mean life that is a log-linear function of stress, along with a cumulative exposure model, is considered as the working model. The problem of choosing the optimal τ is addressed using the variance-optimality criterion. Under this setting, we then show that the optimal k-level step-stress ALT model with unequal duration steps reduces just to a 2-level step-stress ALT model.
    關聯: Journal of Statistical Computation and Simulation 84(4), pp.819-832
    DOI: 10.1080/00949655.2012.729313
    顯示於類別:[數學學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML150檢視/開啟
    index.html0KbHTML5檢視/開啟
    Planning step-stress test under Type-I censoring for the exponential case.pdf499KbAdobe PDF0檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋