English  |  正體中文  |  简体中文  |  Items with full text/Total items : 55178/89446 (62%)
Visitors : 10661005      Online Users : 55
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/97452

    Title: Examining How Manufacturing Corporations Win Orders
    Authors: Tsai, Sang-Bing;Lee, Yu-Cheng;Wu, Chia-Huei;Guo, Jiann-Jong
    Contributors: 淡江大學中國大陸研究所
    Keywords: simultaneous importance-performance analysis (SIPA);decision-making trial and evaluation laboratory (DEMATEL);competitive strategy;win orders;industrial research
    Date: 2013-11
    Issue Date: 2014-03-20
    Publisher: Midrand: South African Institute of Industrial Engineers
    Abstract: This study adopted 14 criteria for order-winners and qualifiers as the attributes for evaluation. The first stage used a simultaneous importance-performance analysis to analyse the competitive market situations of a corporation and its competitors. The second stage used the decision-making trial and evaluation laboratory method to analyse the attributes’ causal relationships and levels of influence; then two methods of analysis were integrated to analyse and re-formulate the competitive strategies for the winning orders. As well as serving as a novel theory-based method to examine how manufacturers win orders, the proposals in this study can be applied to practical industry experiences.
    Relation: South African Journal of Industrial Engineering 24(3), pp.112-124
    DOI: 10.7166/24-3-657
    Appears in Collections:[中國大陸研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback