淡江大學機構典藏:Item 987654321/97405
English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62805/95882 (66%)
Visitors : 3949570      Online Users : 1041
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/97405


    Title: In-Situ XAS Investigation of the Effect of Electrochemical Reaction on the Structure of Graphene in Aqueous Electrolytes
    Authors: Juan J. Velasco-Velez;Chuang, Cheng-Hao;Han, Hui-Ling;Inigo, Martin-Fernandez;Camille Martinez;Pong, Way-Faung;Shen, Yuen-Ron;Wang, Feng;Zhang, Yue-gang;Guo, Jing-hua;Miquel Salmeron
    Contributors: 淡江大學物理學系
    Date: 2013-07-01
    Issue Date: 2014-03-19 17:02:32 (UTC+8)
    Publisher: Electrochemical Society, Inc.
    Abstract: In-situ X-ray Absorption Spectroscopy (XAS), Raman Spectroscopy, AFM and XPS have been used to investigate the effect of reactions occurring in aqueous electrolytes on the structure of a single-layer graphene produced by CVD. It was found that defects are readily and irreversibly produced by application of electrode voltages. The defects and the products were identified also by new features in the XAS spectra. Our findings show the poor stability of the CVD graphene, which could be a challenge in applications such as super-capacitors, fuel-cells, batteries and photo-catalysis.
    Relation: Journal of The Electrochemical Society 160(9), p.445-450
    DOI: 10.1149/2.113309jes
    Appears in Collections:[Graduate Institute & Department of Physics] Journal Article

    Files in This Item:

    File Description SizeFormat
    index.html0KbHTML326View/Open
    J. Electrochem. Soc.-2013-Velasco-Velez-C445-50.pdf1452KbAdobe PDF868View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback