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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/96249


    Title: Characterization of gasochromic vanadium oxides films by X-ray absorption spectroscopy
    Authors: Ho, Y.K.;Chang, C.C.;Wei, D.H.;Dong, C.L.;Chen, C.L.;Chen, J.L.;Jang, W.L.;Hsu, C.C.;Chan, T.S.;Kumar, Krishna;Chang, C.L.;Wu, M.K.
    Contributors: 淡江大學物理學系
    Keywords: Vanadium oxide;Thin films;Gasochromic;Sol–gel;XAS
    Date: 2013-10
    Issue Date: 2014-03-06 16:49:09 (UTC+8)
    Publisher: Lausanne: Elsevier S.A.
    Abstract: A series of vanadium oxide thin films with different layer thicknesses were prepared by the sol–gel process. These V2O5 thin films exhibited excellent gasochromic performance with color change from yellow to gray/black on exposure to hydrogen gas and fast response rate under ambient condition. The structure and morphology of the films were investigated by X-ray powder diffractometer and scanning electron microscope. The H2 gasochromic property and the optical transmittance change of colored and bleached films were characterized by UV–visible spectrophotometer. Further, the gasochromic effect and the coloration mechanism of these films were investigated in detail by X-ray absorption spectroscopy. The investigations demonstrated that due to insertion of hydrogen ions, the valence state of vanadium varied from 4.8+ to 4.1+ and a distortion was observed in the structural symmetry of VO6 octahedron.
    Relation: Thin Solid Films 544, pp.461-465
    DOI: 10.1016/j.tsf.2013.02.080
    Appears in Collections:[物理學系暨研究所] 期刊論文

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