English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 56859/90577 (63%)
造訪人次 : 12301873      線上人數 : 80
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/96089

    題名: The potential application of ultra-nanocrystalline diamond films for heavy ion irradiation detection
    作者: Chen, Huang-Chin;Chen, Shih-Show;Wang, Wei-Cheng;Lee, Chi-Young;Guo, Jinghua;Lin, I-Nan;Chang, Ching-Lin
    貢獻者: 淡江大學物理學系
    日期: 2013-06
    上傳時間: 2014-02-24 09:25:17 (UTC+8)
    出版者: College Park: American Institute of Physics
    摘要: The potential of utilizing the ultra-nanocrystalline (UNCD) films for detecting the Au-ion irradiation was investigated. When the fluence for Au-ion irradiation is lower than the critical value (fc = 5.0 × 1012 ions/cm2) the turn-on field for electron field emission (EFE) process of the UNCD films decreased systematically with the increase in fluence that is correlated with the increase in sp2-bonded phase (π*-band in EELS) due to the Au-ion irradiation. The EFE properties changed irregularly, when the fluence for Au-ion irradiation exceeds this critical value. The transmission electron microscopic microstructural examinations, in conjunction with EELS spectroscopic studies, reveal that the structural change preferentially occurred in the diamond-to-Si interface for the samples experienced over critical fluence of Au-ion irradiation, viz. the crystalline SiC phase was induced in the interfacial region and the thickness of the interface decreased. These observations implied that the UNCD films could be used as irradiation detectors when the fluence for Au-ion irradiation does not exceed such a critical value.
    關聯: AIP Advances 3(6), 062113(20pages)
    DOI: 10.1063/1.4811338
    顯示於類別:[物理學系暨研究所] 期刊論文


    檔案 描述 大小格式瀏覽次數
    2158-3226_3(6)p062113(20pages).pdf6921KbAdobe PDF288檢視/開啟



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋