English  |  正體中文  |  简体中文  |  Items with full text/Total items : 49521/84656 (58%)
Visitors : 7588572      Online Users : 63
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/96039


    Title: A Core-Based Test Methodology for Fast Multipliers
    Authors: Rau, Jiann-Chyi;Lin, Chia-Hung;Lin, Ching-Hsiu
    Contributors: 淡江大學電機工程學系
    Keywords: 快速多工器;測試策略;核心基礎;矽智產;系統單晶片;數位信號處理器;Fast multiplexer;Test strategy;Core-based;Intellectuall property(IP);System-on-a-chip (SOC);Digital signal processor (DSP)
    Date: 2003-08
    Issue Date: 2014-02-13 11:37:54 (UTC+8)
    Abstract: To test core-based SoCs, an important step is to get the efficient test vectors for testing cores. Soft cores are usually provided with hardware description languages such as VHDL and Verilog. It is much more difficult to generate test vectors at higher level than at logic level. For core vendors, they design their IP cores not only add design for testability (DFT) strategyf or its cores, but also provide the most effective test vectors for core users. Based on this issue, in this paper, we propose a method to generate pseudo-exhaustive test patterns at functional level. The proposed method can be used to generate test patterns for IP cores, especially, for soft IPs.
    Relation: 第十四屆超大型積體電路設計暨計算機輔設計技術研討會論文摘要集=Proceedings of The 14th VLSI Design/CAD Symposium,頁437-440
    Appears in Collections:[電機工程學系暨研究所] 會議論文

    Files in This Item:

    File SizeFormat
    A Core-Based Test Methodology for Fast Multipliers_英文摘要.docx15KbMicrosoft Word75View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback