English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 49378/84106 (59%)
造訪人次 : 7370754      線上人數 : 79
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/96038


    題名: Pseudo-Exhaustively Testing VLSI Circuits Using Enhanced Tree-Structured Scan Chains
    作者: Rau, Jiann-Chyi;Kuo, Kuo-Chun;Yang, Ta-Wei
    貢獻者: 淡江大學電機工程學系
    關鍵詞: 準徹底測試;超大規模積體電路;樹狀結構掃描鏈;線性回饋移位暫存器;待測電路;Pseudo-exhaustively testing;Very large scale integrated circuit(VLSI);Tree-structured scan chain;Linear feedback shift register(LFSR);Circuit under test (CUT)
    日期: 2003-08
    上傳時間: 2014-02-13 11:37:47 (UTC+8)
    摘要: As the test pattern requirement of a pseudo-exhaustive testing is fewer than the traditional exhaustive testing, many approaches and architectures are proposed to implement the pseudo-exhaustive testing. Although these methods and architectures employ LFSR to generate the exhaustive pseudo random test patterns could successfully cut down the test time, the same problem of invalid test patterns should still be considered. To avoid these invalidt est patterns, it requires new strategy to solve this problem. Since different seeds of the LFSR dominate different simulation results, seed selection is not arbitrary any more. A suggestive threshold stop point for new strategy, which tries to solve "invalid test patterns" problem, is defined in this paper. Based on the concept of careful seed selection, an enhanced tree-structured scan chain is proposed to shorten total test cycle time again.
    關聯: 第十四屆超大型積體電路設計暨計算機輔設計技術研討會論文摘要集=Proceedings of The 14th VLSI Design/CAD Symposium,頁305-308
    顯示於類別:[電機工程學系暨研究所] 會議論文

    文件中的檔案:

    檔案 大小格式瀏覽次數
    Pseudo-Exhaustively Testing VLSI Circuits Using Enhanced Tree-Structured Scan Chains_英文摘要.docx16KbMicrosoft Word61檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋