In this paper, an efficient algorithm to diagnose design errors in RTL description is proposed. The diagnosis algorithm exploits the hierarchy available in RTL designs to locate design errors. Using data-path to reduce the number of error candidates and ensure that true errors are included in. According to the estimated probability, the most suspected error candidates would be reported first in the display. The advantages of the proposed method are simple and available.
第十四屆超大型積體電路設計暨計算機輔設計技術研討會論文摘要集=Proceedings of The 14th VLSI Design/CAD Symposium，頁153-156