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    題名: Loycal atomic and electronic structures and ferroelectric properties of PbZr0.52Ti0.48O3: An x-ray absorption study
    作者: Ray, S.C.;Hsueh, H.C.;Wu, C.H.;Pao, C.W.;Asokan, K.;Liu, M.T.;Tsai, H.M.;Chuang, C.H.;Pong, W.F.;Chiou, J.W.;Tsai, M.-H.;Lee, J.M.;Jang, L.Y.;Chen, J.M.;Lee, J.-F.
    貢獻者: 淡江大學物理學系
    日期: 2011-07
    上傳時間: 2014-01-10 09:09:32 (UTC+8)
    出版者: College Park: American Institute of Physics
    摘要: This work investigates local atomic and electronic structures of PbZr0.52Ti0.48O3 (PZT) thin films with <001>, <101>, and <111> orientations using extended x-ray absorption fine structure (EXAFS) and x-ray absorption near-edge structure (XANES) spectroscopy with θ = 0° and 70° incident angles. The EXAFS result indicates that the <001>-oriented PZT film has a polarization dominantly along the c -axis, while both <101>- and <111>-oriented PZT films have a dominant in- ab -plane polarization. The hysteresis-loop measurements show that the <001>-oriented PZT film has a much larger coercive field than those of other two PZT films, which indicates that the double-well potential along the c -axis is much deeper than that in the ab -plane.
    關聯: Applied Physics Letters 99(4), 042909(3pages)
    DOI: 10.1063/1.3607475
    顯示於類別:[物理學系暨研究所] 期刊論文

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