English  |  正體中文  |  简体中文  |  Items with full text/Total items : 49432/84393 (59%)
Visitors : 7454682      Online Users : 95
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/93265

    Title: 半雙曲線假設對壓電材料動力破壞分析之影響研究
    Other Titles: Investigation of Effects on Dynamic Fracture Analysis for Piezoelectric Materials due to Quasi-hyperbolic Assumption
    Authors: 應宜雄;謝友誌
    Contributors: 淡江大學航空太空工程學系
    Keywords: 半雙曲線假設;壓電的;裂紋;;力強度因子;振動;quasi-hyperbolicassumption;piezoelectric;crack;stress intensity factor;vibration
    Date: 2008-12
    Issue Date: 2013-12-13 15:52:27 (UTC+8)
    Publisher: 臺北市:中華民國航空太空學會
    Abstract: 本文利用半雙曲線近似下推導而得的線彈性壓電控制方程式與本構方程式,解析一含有限長裂紋之無窮域壓電材料,於裂紋面上施加反平面庭; 力及平面電位移的簡諧載荷問題。本文利用積分轉換法求得含裂紋之壓電材料受簡諧載荷時的解析解,並與穩靜態近似下所得到之解作比較。最後針對所求之應力強度因子振幅大小以及相位,做詳細的數值計算與討論。
    In this study, the quasi-hyperbolic approximation is used to investigate the dynamic behavior of a crack under the action of anti-plane stresses and in-plane electric displacements in a piezoelectric material. First, the steady-state response of a finite crack subjected to harmonically anti-plane loading and in-plane electric displacement on crack faces is analyzed. The stress intensity factors and electric displacement intensity factors are obtained for the problem. Finally, numerical results of the first problem are evaluated and discussed in detail.
    Relation: 中華民國航空太空學會第五十屆年會暨學術研討會國科會航太學門成果發表會會議首冊暨論文摘要集,頁106
    Appears in Collections:[航空太空工程學系暨研究所] 會議論文

    Files in This Item:

    There are no files associated with this item.

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback