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    题名: Optimal Design for Accelerated Destructive Degradation Tests
    作者: Tsai, Chih-Chun;Tseng, Sheng-Tsaing;Balakrishnan, N.;Lin, Chien-Tai
    贡献者: 淡江大學數學學系
    关键词: Accelerated destructive degradation tests;arrhenius equation;highly reliable products, optimal test plan
    日期: 2013-01-01
    上传时间: 2013-10-08 10:02:55 (UTC+8)
    出版者: 新竹市:交通大學出版社
    摘要: Degradation tests are powerful and useful tools for lifetime assessment of highly reliable
    products. In some applications, the degradation measurement process would destroy the physical
    characteristic of units when tested at higher than usual stress levels of an accelerating variable such as
    temperature, so that only one measurement can be made on each tested unit during the degradation
    testing. An accelerated degradation test giving rise to such a degradation data is called an accelerated
    destructive degradation test (ADDT). The specification of the size of the total sample, the frequency of
    destructive measurements, the number of measurements at each stress level, and other decision variables
    are very important to plan and conduct an ADDT efficiently. A wrong choice of these decision variables
    may not only result in increasing the experimental cost, but may also yield an imprecise estimate of the
    reliability of the product at the use condition. Motivated by a polymer data, this article deals with the
    problem of designing an ADDT with a nonlinear model. Under the constraint that the total experimental
    cost does not exceed a pre-fixed budget, the optimal test plan is obtained by minimizing the asymptotic
    variance of the estimated 100 p th percentile of the product’s lifetime distribution at the use condition. A
    sensitivity analysis is also carried out to examine the effects of changes in the decision variables on the
    precision of the estimator of the 100 p th percentile. A simulation study further shows that the simulated
    values are quite close to the asymptotic values when the sample sizes are large enough.
    關聯: Quality Technology & Quantitative Management 10(3), pp.263-276
    DOI: 10.1080/16843703.2013.11673413
    显示于类别:[數學學系暨研究所] 期刊論文

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