Thickness-Dependent Electronic Structure of Intermetallic CeCo2 Nanothin Films Studied by X-ray Absorption Spectroscopy

淡江大學機構典藏 > 理學院 > 物理學系暨研究所 > 期刊論文 > Item 987654321/91620

請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/91620

題名:	Thickness-Dependent Electronic Structure of Intermetallic CeCo2 Nanothin Films Studied by X-ray Absorption Spectroscopy
作者:	Dong, Chung-Li;Chen, Chi-Liang;Asokan, Kandasami;Chang, Ching-Lin;Chen, Yang-Yuan;Lee, Jyh-Fu;Guo, Jinghua
貢獻者:	淡江大學物理學系
日期:	2009
上傳時間:	2013-07-18 15:06:01 (UTC+8)
出版者:	Washington, DC: American Chemical Society
摘要:	We report the electronic structure study of intermetallic CeCo2 nanothin films of various thicknesses by X-ray absorption near-edge structure (XANES) spectroscopy at Ce L3-, Co K-, and L2,3-edges. The Ce L3-edge absorption spectra reveal that the contribution of tetravalent Ce component increases with the film thickness, and all investigated nanothin films exhibit intermediate valence nature. Variation of the spectral intensities observed at the Co K-edge threshold implies modification in the Co 3d states and the enhancement of 3d-4f-5d hybridization. The Co 3d and Ce 4f occupation numbers were estimated from these spectroscopic results. The present study brings out how the surface-to-bulk ratio and the charge transfer between Ce and Co ions affect the electronic structure of nanothin films.
關聯:	Langmuir 25(13), pp.7568-7572
DOI:	10.1021/la803872w
顯示於類別:	[物理學系暨研究所] 期刊論文

文件中的檔案:

檔案	大小	格式	瀏覽次數
index.html	0Kb	HTML	297	檢視/開啟
index.html	0Kb	HTML	68	檢視/開啟
Thickness-Dependent Electronic Structure of Intermetallic CeCo2 Nanothin Films Studied by X-ray Absorption Spectroscopy.pdf	1014Kb	Adobe PDF	1	檢視/開啟

在機構典藏中所有的資料項目都受到原著作權保護.

TAIR相關文章