淡江大學機構典藏:Item 987654321/91600
English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 62805/95882 (66%)
造訪人次 : 3885782      線上人數 : 488
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧：
  • 您可在西文檢索詞彙前後加上"雙引號"，以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋，建議至進階搜尋限定作者欄位，可獲得較完整資料
    •  進階搜尋


    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/91600


    題名: Evaluation of the Mean Life of LEDs under the Accelerated Degradation Test
    作者: Tsai, Tzong-Ru;Lin, Chin-Wei;Chen, Chiu-Ling;Huang, Sheng-Bang
    貢獻者: 淡江大學統計學系
    關鍵詞: Degradation test;Inverse Gaussian distribution;Light emitting diodes;Lumen maintenance;Wiener Process
    日期: 2009-12
    上傳時間: 2013-07-15 10:04:47 (UTC+8)
    出版者: Kumamoto: ICIC International
    摘要: This paper provides a simple estimation procedure to evaluate the mean life to failure of high power light emitting diodes. An experiment of accelerated degradation test with high power light emitting diodes is conducted lasting 9022 hours. Degradation paths are collected and used to illustrate the proposed method. The example indicates that the proposed method works well, and it is easy to operate to engineers.
    關聯: ICIC Express Letters 3(4)pt.B, pp.1471-1476
    顯示於類別:[統計學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML24檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋