淡江大學機構典藏:Item 987654321/91600
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    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/91600


    Title: Evaluation of the Mean Life of LEDs under the Accelerated Degradation Test
    Authors: Tsai, Tzong-Ru;Lin, Chin-Wei;Chen, Chiu-Ling;Huang, Sheng-Bang
    Contributors: 淡江大學統計學系
    Keywords: Degradation test;Inverse Gaussian distribution;Light emitting diodes;Lumen maintenance;Wiener Process
    Date: 2009-12
    Issue Date: 2013-07-15 10:04:47 (UTC+8)
    Publisher: Kumamoto: ICIC International
    Abstract: This paper provides a simple estimation procedure to evaluate the mean life to failure of high power light emitting diodes. An experiment of accelerated degradation test with high power light emitting diodes is conducted lasting 9022 hours. Degradation paths are collected and used to illustrate the proposed method. The example indicates that the proposed method works well, and it is easy to operate to engineers.
    Relation: ICIC Express Letters 3(4)pt.B, pp.1471-1476
    Appears in Collections:[Graduate Institute & Department of Statistics] Journal Article

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