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    题名: Evaluation of the Mean Life of LEDs under the Accelerated Degradation Test
    作者: Tsai, Tzong-Ru;Lin, Chin-Wei;Chen, Chiu-Ling;Huang, Sheng-Bang
    贡献者: 淡江大學統計學系
    关键词: Degradation test;Inverse Gaussian distribution;Light emitting diodes;Lumen maintenance;Wiener Process
    日期: 2009-12
    上传时间: 2013-07-15 10:04:47 (UTC+8)
    出版者: Kumamoto: ICIC International
    摘要: This paper provides a simple estimation procedure to evaluate the mean life to failure of high power light emitting diodes. An experiment of accelerated degradation test with high power light emitting diodes is conducted lasting 9022 hours. Degradation paths are collected and used to illustrate the proposed method. The example indicates that the proposed method works well, and it is easy to operate to engineers.
    關聯: ICIC Express Letters 3(4)pt.B, pp.1471-1476
    显示于类别:[統計學系暨研究所] 期刊論文

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