English  |  正體中文  |  简体中文  |  Items with full text/Total items : 51296/86402 (59%)
Visitors : 8160560      Online Users : 95
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/90569


    Title: The effect of dislocations on crack propagation in wrinkled gold film deposited on polydimethylsiloxane
    Authors: Lin, C. B.;Lin, C. C.;Lee, Sanboh;Chou, Y. T.
    Contributors: 淡江大學機械與機電工程學系
    Keywords: cracks;dislocations;fracture;gold;metallic thin films
    Date: 2008
    Issue Date: 2013-06-27 15:48:33 (UTC+8)
    Publisher: College Park: American Institute of Physics
    Abstract: Crack propagation in a wrinkled thin film of gold deposited on polydimethylsiloxane (PDMS) was affected by the presence of folding defects—the ripple dislocations. The ripple pattern, ripple dislocations, and the crack were simultaneously formed after the tensile load applied on the PDMS substrate was removed. The crack, however, was unstable and propagated forward. The propagation rate increased when the crack passed by the ripple dislocations, but less significantly when it advanced near a ripple dislocation dipole. Such crack dislocation interaction implies that the ripple dislocation has an internal stress field. The measured data of the rate process were analyzed based on the theory of fracture mechanics, and an empirical relationship between the crack velocity and the crack extension force was presented.
    Relation: Journal of Applied Physics 104(1), 016106(3pages)
    DOI: 10.1063/1.2952511
    Appears in Collections:[機械與機電工程學系暨研究所] 期刊論文

    Files in This Item:

    File Description SizeFormat
    1.2952511.pdf513KbAdobe PDF221View/Open
    index.html0KbHTML163View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.


    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback