淡江大學機構典藏:Item 987654321/90466
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    Title: A new process capability analysis chart approach on the chip resistor quality management
    Authors: Ouyang, Liang-Yuh;Hsu, Chang-Hsien;Yang, Chun-Ming
    Contributors: 淡江大學管理科學學系
    Keywords: Accuracy;discrimination distance;precision;process capability analysis chart;process capability indices
    Date: 2013-07
    Issue Date: 2013-06-27 10:58:23 (UTC+8)
    Publisher: London: Sage Publications Ltd.
    Abstract: Process capability indices have been extensively used to determine whether the quality characteristics of the product meet the preset targets of the customer in manufacturing industries. However, these existing process capability indices cannot categorically determine improvement priorities for substandard quality characteristics. Besides, process capability indices also cannot effectively identify and measure deficiencies in process capability owing to accuracy, precision, or both. In this study, we combine the process capability index Cpm , minimum individual process capability C 0, accuracy A, and precision P to develop a new process capability analysis chart. Managers can apply process capability analysis chart to identify the substandard quality characteristics of the product. Furthermore, if the budget for all substandard quality characteristics improvements is limited, we use the discrimination distance method to measure and determine improvement priorities for substandard quality characteristics. Moreover, we construct an implementation flowchart of the process capability analysis chart to derive the results easily. Finally, an example of a chip resistor is presented to illustrate the applicability of the process capability analysis chart for manufacturing quality management.
    Relation: Journal of Engineering Manufacture 227(7), pp.1075-1082
    DOI: 10.1177/0954405413479790
    Appears in Collections:[Department of Management Sciences] Journal Article

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