English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 49432/84393 (59%)
造訪人次 : 7454310      線上人數 : 88
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/89123

    題名: On the Monitoring of Simple Linear Berkson Profiles
    作者: Wang, Yi-Hua Tina;Huwang, Longcheen
    貢獻者: 淡江大學統計學系
    關鍵詞: average run length;change point;control chart;EWMA;generalized likelihood ratio
    日期: 2012-01-10
    上傳時間: 2013-05-16 14:27:32 (UTC+8)
    出版者: John Wiley & Sons Ltd.
    摘要: We consider the quality of a process, which can be characterized by a simple linear Berkson profile. One existing approach for monitoring the simple linear profile and two new proposed schemes are studied for charting the simple linear Berkson profile. Simulation studies demonstrate the effectiveness and efficiency of one of the proposed monitoring schemes. In
    addition, a systematic diagnostic approach is provided to spot the change point location of the process and to identify the parameter of change in the profile. Finally, an example from semiconductor manufacturing is used to illustrate the implementation of the proposed monitoring scheme and diagnostic approach.
    關聯: Quality and Reliability Engineering International 28(8), pp.949-965
    DOI: 10.1002/qre.1286
    顯示於類別:[統計學系暨研究所] 期刊論文


    檔案 描述 大小格式瀏覽次數
    2012berkson profile.pdf383KbAdobe PDF281檢視/開啟



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋