Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data

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題名:	Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data
作者:	Lee, Hsiu-Mei;Wu, Jong-Wuu;Lei, Chia-Ling
貢獻者:	淡江大學統計學系
關鍵詞:	Hypothesis testing procedure;lifetime performance index;maximum likelihood estimator;step-stress accelerated life test;type II right censored data
日期:	2013-03-01
上傳時間:	2013-04-25 14:44:43 (UTC+8)
出版者:	Piscataway: Institute of Electrical and Electronics Engineers
摘要:	Lifetime performance assessment has been crucial to the manufacturing industry. In practice, a lifetime performance index CL is used to measure the larger-the-better type quality characteristics. Accelerated life test (ALT) has often been used to yield information quickly so that the life distribution of products can be estimated. This study constructs a maximum likelihood estimator (MLE) of CL for exponential products based on type II right censored data from the step-stress accelerated life test (SSALT). The MLE of CL is then utilized to develop the hypothesis testing procedure with the given lower specification limit L . This new testing procedure can be easily applied to assess whether the lifetime of products meets the requirements. Finally, we give two examples to explicate the proposed testing procedures.
關聯:	IEEE Transactions on Reliability 62(1), pp.296-304
DOI:	10.1109/TR.2013.2241197
顯示於類別:	[統計學系暨研究所] 期刊論文

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