English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 58323/91876 (63%)
造访人次 : 14077872      在线人数 : 87
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/88824


    题名: Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data
    作者: Lee, Hsiu-Mei;Wu, Jong-Wuu;Lei, Chia-Ling
    贡献者: 淡江大學統計學系
    关键词: Hypothesis testing procedure;lifetime performance index;maximum likelihood estimator;step-stress accelerated life test;type II right censored data
    日期: 2013-03-01
    上传时间: 2013-04-25 14:44:43 (UTC+8)
    出版者: Piscataway: Institute of Electrical and Electronics Engineers
    摘要: Lifetime performance assessment has been crucial to the manufacturing industry. In practice, a lifetime performance index CL is used to measure the larger-the-better type quality characteristics. Accelerated life test (ALT) has often been used to yield information quickly so that the life distribution of products can be estimated. This study constructs a maximum likelihood estimator (MLE) of CL for exponential products based on type II right censored data from the step-stress accelerated life test (SSALT). The MLE of CL is then utilized to develop the hypothesis testing procedure with the given lower specification limit L . This new testing procedure can be easily applied to assess whether the lifetime of products meets the requirements. Finally, we give two examples to explicate the proposed testing procedures.
    關聯: IEEE Transactions on Reliability 62(1), pp.296-304
    DOI: 10.1109/TR.2013.2241197
    显示于类别:[統計學系暨研究所] 期刊論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data.pdf1882KbAdobe PDF0检视/开启
    index.html0KbHTML42检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈