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    Title: Assessing the lifetime performance index of exponential products with step-stress accelerated life-testing data
    Authors: Lee, Hsiu-Mei;Wu, Jong-Wuu;Lei, Chia-Ling
    Contributors: 淡江大學統計學系
    Keywords: Hypothesis testing procedure;lifetime performance index;maximum likelihood estimator;step-stress accelerated life test;type II right censored data
    Date: 2013-03
    Issue Date: 2013-04-25 14:44:43 (UTC+8)
    Publisher: Piscataway: Institute of Electrical and Electronics Engineers
    Abstract: Lifetime performance assessment has been crucial to the manufacturing industry. In practice, a lifetime performance index CL is used to measure the larger-the-better type quality characteristics. Accelerated life test (ALT) has often been used to yield information quickly so that the life distribution of products can be estimated. This study constructs a maximum likelihood estimator (MLE) of CL for exponential products based on type II right censored data from the step-stress accelerated life test (SSALT). The MLE of CL is then utilized to develop the hypothesis testing procedure with the given lower specification limit L . This new testing procedure can be easily applied to assess whether the lifetime of products meets the requirements. Finally, we give two examples to explicate the proposed testing procedures.
    Relation: IEEE Transactions on Reliability 62(1), pp.296-304
    DOI: 10.1109/TR.2013.2241197
    Appears in Collections:[統計學系暨研究所] 期刊論文

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