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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/88144


    Title: An efficient test data compression scheme using selection expansion
    Other Titles: 使用選擇器擴充方法達成高效率的測試壓縮架構
    Authors: 陳功瀚;Chen, Kung-Han
    Contributors: 淡江大學電機工程學系碩士班
    饒建奇;Rau, Jiann-Chyi
    Keywords: 積體電路;測試;自我測試;VLSI;Testing;BIST
    Date: 2012
    Issue Date: 2013-04-13 12:02:45 (UTC+8)
    Abstract: 當現今的積體電路,功能越來越強大,相對地,邏輯閘數目也越來越多,也許是擁有兆級以上邏輯閘的電路。要測試這樣大的電路,變得越加困難,相當不容易。通常需要用到非常大量的測試資料才能完成測試。但是通常自動測試機台(Automatic Test Equipment,ATE)的記憶體容量並沒有這麼大,而且使用的測試資料數多時,將非常秏時及秏電。因此,必需將測試資料進行壓縮(test data compression)。我們利用多重輸入位移暫存器(MISR)可使一個進入的資料在硬體裡跑多次的特性,發展出我們的硬體架構。 本架構可使一個輸入資料在架構經過多個週期,進而產生大量資料。我們利用多重輸入位移暫存器作為我們解壓縮器的核心。並且利用高期消去法得到我們在測試機台的資料,或者說壓縮後的資料。在本架構中,我們利用一個選擇器和多個正反器(Flip-Flop)來擴充我們的資料,因為多重輸入位移暫存器裡的正反器會與多個選擇器相連,藉此擴充資料。在自動測試機台內的資料經由我們的解壓縮器反解後,得到了大量而有效的測試資料。而在選擇器產生資料後,我們會經由一組的正反器將其資料進行儲存。而我們可以讓這些正反器配合一些多工器,這樣一來我們只要在需要改變資料時才給予這多工器轉換的資料,如此一來,我們就不需要太頻繁的去改變資料,進而可以節省功率消秏。而一個自動測試機器的資料將在我們的架構中跑多次的特性,在這一時間中,硬體電路可以去作其他的事情,如此一來將可提升速度。
    Because MISR (Multiple input shift register) can use one ATE data run a lot of times in it. We use this characteristic to let one data run lots of times in MISR to generate a lot of patterns. MISR is the foundation of our decompressor .And using Gauss-Elimination to get the ATE data. Selection with Flip-Flop can spread MISR data, because one Flip-Flop of MISR connected with two MUXs of Selection. The Selection connected with the MISR. Flip-Flops are connected with the Selection. The original ATE is spreading by our decompressor architecture. And using the Flip-Flops can restore the bits in it, we just changing the Flip-Flops bits when the data is changed. Because the bits of Flip-Flops are not changing frequently, we can save power. And one ATE data run a lot of cycles in the decompressor architecture, so the time is saving by this way.
    Appears in Collections:[電機工程學系暨研究所] 學位論文

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