Optimal unknown bit filtering for test response masking

淡江大學機構典藏 > 工學院 > 電機工程學系暨研究所 > 學位論文 > Item 987654321/88087

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題名:	Optimal unknown bit filtering for test response masking
其他題名:	更佳的遮罩測試響應的未知值
作者:	翁定克;Weong, Ding-Ke
貢獻者:	淡江大學電機工程學系碩士班饒建奇;Rau, Jiann-Chyi
關鍵詞:	測試響應;遮罩未知值;壓縮器;test response;X-masking;compaction
日期:	2012
上傳時間:	2013-04-13 12:00:11 (UTC+8)
摘要:	IC測試發展至今，在LFDR與MISR已經能提供很高的壓縮率，不幸的是測試輸出有未知值(X)混在裡面，導致壓縮器的輸出信號失去可靠性。很多的研究加入X遮罩邏輯(XML)連接在測試響應(test response)與壓縮器 (compactor)之間，由於簡單的反饋電路防止X狀態擴散。但X遮罩邏輯(XML)必須加入額外的控制碼，這樣使得效率難以提高。本篇文章所提出的行列XML是一個新型的組合電路。我們的方法能阻斷X傳遞，且用較少的控制碼，但是產生控制碼不像XML這麼直接，因此同時提出產生控制碼的演算方法，能夠有效地遮罩X且觀察到較多的錯誤(fault)，最後，在我們最好的實驗結果，優於XML壓縮率達6.65%。 With developments of IC testing, LFSR and MISR technologies provide very high compression rate. However, unknown (X) states which decrease the reliability are injected into compactor. Many researches added the X-masking logic (XML) which connects between test response and compactor and prevents multiplication of X states due to their simple feedback circuitry. Further, the XML needs to add extra control codes which make it difficult to improve the efficiency. This thesis proposed the method, row-column XML, which is a novel combinational circuit. Our method can block the propagation of X and also use less control codes, but it cannot direct generate control codes as XML. So we also provided the generation algorithm of control code which can mask X efficiently and observe more testing faults. Finally, in best case, our experimental results obtains better compression rate than XML about 6.65%.
顯示於類別:	[電機工程學系暨研究所] 學位論文

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