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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/88087

    Title: Optimal unknown bit filtering for test response masking
    Other Titles: 更佳的遮罩測試響應的未知值
    Authors: 翁定克;Weong, Ding-Ke
    Contributors: 淡江大學電機工程學系碩士班
    饒建奇;Rau, Jiann-Chyi
    Keywords: 測試響應;遮罩未知值;壓縮器;test response;X-masking;compaction
    Date: 2012
    Issue Date: 2013-04-13 12:00:11 (UTC+8)
    Abstract: IC測試發展至今,在LFDR與MISR已經能提供很高的壓縮率,不幸的是測試輸出有未知值(X)混在裡面,導致壓縮器的輸出信號失去可靠性。很多的研究加入X遮罩邏輯(XML)連接在測試響應(test response)與壓縮器 (compactor)之間,由於簡單的反饋電路防止X狀態擴散。但X遮罩邏輯(XML)必須加入額外的控制碼,這樣使得效率難以提高。
    With developments of IC testing, LFSR and MISR technologies provide very high compression rate. However, unknown (X) states which decrease the reliability are injected into compactor. Many researches added the X-masking logic (XML) which connects between test response and compactor and prevents multiplication of X states due to their simple feedback circuitry. Further, the XML needs to add extra control codes which make it difficult to improve the efficiency.
    This thesis proposed the method, row-column XML, which is a novel combinational circuit. Our method can block the propagation of X and also use less control codes, but it cannot direct generate control codes as XML. So we also provided the generation algorithm of control code which can mask X efficiently and observe more testing faults. Finally, in best case, our experimental results obtains better compression rate than XML about 6.65%.
    Appears in Collections:[電機工程學系暨研究所] 學位論文

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