本研究利用熱壁式磊晶系統製作出CdSSe/ZnSe多層膜,並運用熱壁式磊晶系統的高真空和可條整烘烤溫度的優點來對樣品做熱退火,界此找出ZnSe與CdS薄膜之最佳平坦程度,利於發光層生長。觀察ZnSe、CdS、CdSSe不同厚度之發光波長,並試著用ZnSe所發出來的藍光及利用CdSSe所發出來的黃光製作多層膜樣品,看看是否可以調和成白光。 In this study is used the Hot-Wall Epitaxy System produce CdSSe/ZnSe multilayers ,and used of Hot-Wall Epitaxy System’s high vacuum and can strip the whole of the baking temperature thermal annealing samples, by this to find out ZnSe and Cds thin films in the best flat extent , and conductive to growth the light-emitting layers.Observation ZnSe、 CdS、CdSSe’s emission wavelength of different thickness.Use the ZnSe emission blue light and CdSSe emission yellow light to try to produce multilayer samples,and try to reconcile into white light.