English  |  正體中文  |  简体中文  |  Items with full text/Total items : 62378/95055 (66%)
Visitors : 2302981      Online Users : 146
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
Scope Tips:
  • please add "double quotation mark" for query phrases to get precise results
  • please goto advance search for comprehansive author search
  • Adv. Search
    HomeLoginUploadHelpAboutAdminister Goto mobile version
    Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/82989

    Title: Microwave imaging of a partially immersed non-uniform conducting cylinder
    Authors: Chien, Wei;Chiu, Chien-Ching;Li, Ching-Lieh;Sun, Chi-Hsien
    Contributors: 淡江大學電機工程學系
    Keywords: Inverse problem;non-uniform conducting cylinder;partially immersed;steady-state genetic algorithm
    Date: 2012-11-09
    Issue Date: 2013-03-13 02:46:06 (UTC+8)
    Publisher: Amsterdam: I O S Press
    Abstract: In this paper, we investigate the imaging problem to determine both the shape and the conductivity of a partially immersed non-uniform conducting cylinder from the knowledge of scattered far-field pattern of TM waves by solving the ill-posed nonlinear equation. Based on the boundary condition and the measured scattered field, a set of nonlinear integral equations is derived and the inverse problem is reformulated into an optimization one. The steady-state genetic algorithm is then employed to find out the global extreme solution of the object function. As a result, the shape and the conductivity of the conductor can be obtained. Numerical results are given to demonstrate that even in the presence of noise, good reconstruction can be obtained.
    Relation: International Journal of Applied Electromagnetics and Mechanics 40(3), pp.215-225
    DOI: 10.3233/JAE-2012-1586
    Appears in Collections:[Graduate Institute & Department of Electrical Engineering] Journal Article

    Files in This Item:

    File Description SizeFormat
    1383-5416_40(3)p215-225.pdf512KbAdobe PDF384View/Open

    All items in 機構典藏 are protected by copyright, with all rights reserved.

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - Feedback