淡江大學機構典藏:Item 987654321/80603
English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 62830/95882 (66%)
造访人次 : 4038456      在线人数 : 561
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧：
  • 您可在西文检索词汇前后加上"双引号"，以获取较精准的检索结果
  • 若欲以作者姓名搜寻，建议至进阶搜寻限定作者字段，可获得较完整数据
    •  进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/80603


    题名: Soft X-ray characterization of Zn1−xSnxOy electronic structure for thin film photovoltaics
    作者: Mukes Kapilashrami;Coleman X. Kronawitter;Tobias Törndahl;Johan Lindahl;Adam Hultqvist;Wei-Cheng Wang;Chang, Ching-Lin;Samuel S. Mao;Jinghua Guo
    贡献者: 淡江大學物理學系
    关键词: Mukes Kapilashrami;Coleman X. Kronawitter;Tobias Törndahl;Johan Lindahl;Adam Hultqvist;Wei-Cheng Wang;Chang, Ching-Lin;Samuel S. Mao;Jinghua Guo
    日期: 2012-06-21
    上传时间: 2013-02-20 13:46:04 (UTC+8)
    出版者: Cambridge: R S C Publications
    摘要: Zinc tin oxide (Zn1−xSnxOy) has been proposed as an alternative buffer layer material to the toxic, and light narrow-bandgap CdS layer in CuIn1−x,GaxSe2 thin film solar cell modules. In this present study, synchrotron-based soft X-ray absorption and emission spectroscopies have been employed to probe the densities of states of intrinsic ZnO, Zn1−xSnxOy and SnOx thin films grown by atomic layer deposition. A distinct variation in the bandgap is observed with increasing Sn concentration, which has been confirmed independently by combined ellipsometry-reflectometry measurements. These data correlate directly to the open circuit potentials of corresponding solar cells, indicating that the buffer layer composition is associated with a modification of the band discontinuity at the CIGS interface. Resonantly excited emission spectra, which express the admixture of unoccupied O 2p with Zn 3d, 4s, and 4p states, reveal a strong suppression in the hybridization between the O 2p conduction band and the Zn 3d valence band with increasing Sn concentration.
    關聯: Physical Chemistry Chemical Physics 14, p.10154-10159
    DOI: 10.1039/C2CP41394A
    显示于类别:[物理學系暨研究所] 期刊論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html0KbHTML56检视/开启
    Soft X-ray characterization of Zn1−xSnxOy electronic structure for thin film photovoltaics.pdf1809KbAdobe PDF498检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈