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題名: | Correlation between p-type conductivity and electronic structure of Cr-deficient CuCr1-xO2 (x = 0--0.1) |
作者: | Singh, S. B.;Yang, L. T.;Wang, Y. F.;Shao, Y. C.;Chiang, C. W.;Chiou, J. W.;Lin, K. T.;Chen, S. C.;Wang, B. Y.;Chuang, C. H.;Ling, D. C.;Pong, W. F.;Tsai, M.-H.;Tsai, H. M.;Pao, C. W.;Shiu, H. W.;Chen, C. H.;Lin, H.-J.;Lee, J. F.;Yamane, H.;Kosugi, N. |
貢獻者: | 淡江大學物理學系 |
日期: | 2012-12-07 |
上傳時間: | 2013-01-25 11:10:44 (UTC+8) |
出版者: | College Park: American Physical Society |
摘要: | The correlation between the p-type hole conduction and the electronic structures of Cr-deficient CuCr1−xO2 (x=0−0.1) compounds was investigated using O K-, Cu, and Cr L3,2-edge x-ray absorption near-edge structure (XANES), scanning photoelectron microscopy, and x-ray emission spectroscopy measurements. XANES spectra reveal a gradual increase in the Cu valence from Cu1+ to Cu2+ with increasing Cr deficiency x, whereas, the valence of Cr remains constant as Cr3+. These results indicate that the p-type conductivity in the CuCr1−xO2 samples is enhanced by a Cu1+-O-Cu2+ rather than a Cr3+-Cr4+ or direct Cu1+-Cu2+ hole mechanism. Remarkable Cr-deficiency-induced changes in the densities of Cu 3d, Cu 3d-O 2p, and O 2p states at or near the valence-band maximum or the Fermi level were also observed. In addition, a crossover of conduction mechanism from thermally activated (TA) hopping to a combination of TA and Mott's three-dimensional variable range hopping occurs around 250 K. |
關聯: | Physical Review B: Condensed Matter and Materials Physics 86(24), 241103(R)(6pages) |
DOI: | 10.1103/PhysRevB.86.241103 |
顯示於類別: | [物理學系暨研究所] 期刊論文
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