English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 56848/90584 (63%)
造访人次 : 12154732      在线人数 : 143
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻

    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/80354

    题名: An integrated vendor-buyer inventory model with defective items and partial backlogging
    作者: Ho, Chia-Huei;Suresh Kumar Goya;Ouyang, Liang-Yuh;Wu, Kun-Shan
    贡献者: 淡江大學管理科學學系;淡江大學企業管理學系
    关键词: integrated inventories;inventory models;defective items;partial backlogging;backlogs;defects;vendors;buyers;arrival orders;order lots;lead-time demand;markets, normal distribution;inspection strategies;order quantities;reorder points;shipment numbers;decision variables;optimal solutions;production strategies;inventory strategies;parameters;logistics systems;logistics management
    日期: 2011-04-11
    上传时间: 2013-01-23 10:35:04 (UTC+8)
    出版者: Bucks: Inderscience Publishers
    摘要: This paper investigates the integrated vendor-buyer inventory model in which each buyer's arrival order lot contains a random proportion of defective items and the lead-time demand in the market has a normal distribution. The inspection strategy adopted here is that the buyer inspects all the items before selling, allowing defective items to be discovered and returned to the vendor. We formulated an integrated vendor-buyer inventory model with partial backlogging, in which the order quantity, reorder point and the number of shipments from the vendor to the buyer are decision variables. An algorithm was developed to obtain the optimal production and inventory strategy. Furthermore, the affect of parameters on the optimal solution is also discussed.
    關聯: International Journal of Logistics Systems and Management 8(4), pp.377-391
    DOI: 10.1504/IJLSM.2011.039596
    显示于类别:[管理科學學系暨研究所] 期刊論文
    [企業管理學系暨研究所] 期刊論文


    档案 描述 大小格式浏览次数



    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈