Test Slice Difference Technique for Low-Transition Test Data Compression

淡江大學機構典藏 > 工學院 > 電機工程學系暨研究所 > 期刊論文 > Item 987654321/78157

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题名:	Test Slice Difference Technique for Low-Transition Test Data Compression
作者:	饒建奇;吳柏翰;李威霖
贡献者:	淡江大學電機工程學系
关键词:	Test Data Compression;Low Power Testing;VLSI;Design for Testability (DFT)
日期:	2012-06
上传时间:	2012-09-07 18:53:55 (UTC+8)
出版者:	Taiwan : Tamkang University
摘要:	This paper presents a low power strategy for test data compression and a new decompression scheme for test vectors. In our method, we propose an efficient algorithm for scan chain reordering to deal with the power dissipation problem. Further, we also propose a test slice difference (TSD) technique to improve test data compression. It is an efficient method and only needs one extra scan cell. In experimental results, the scheme that we presented achieve high compression ratio. The power consumption is also better compared with other well-known compression techniques.
關聯:	淡江理工學刊 = Tamkang Journal of Science and Engineering 15(2), p.157-166
DOI:	10.6180/jase.2012.15.2.09
显示于类别:	[電機工程學系暨研究所] 期刊論文

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2012-07 Test Slice Difference Technique for Low-Transition Test Data Compression.pdf		3370Kb	Adobe PDF	371	检视/开启

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