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    Please use this identifier to cite or link to this item: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/78157


    Title: Test Slice Difference Technique for Low-Transition Test Data Compression
    Authors: 饒建奇;吳柏翰;李威霖
    Contributors: 淡江大學電機工程學系
    Keywords: Test Data Compression;Low Power Testing;VLSI;Design for Testability;DFT
    Date: 2012-06
    Issue Date: 2012-09-07 18:53:55 (UTC+8)
    Publisher: Taiwan : Tamkang University
    Relation: 淡江理工學刊 = Tamkang Journal of Science and Engineering 15(2), pp.157-166
    DOI: 10.6180/jase.2012.15.2.09
    Appears in Collections:[電機工程學系暨研究所] 期刊論文

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