Test Slice Difference Technique for Low-Transition Test Data Compression

淡江大學機構典藏 > 工學院 > 電機工程學系暨研究所 > 期刊論文 > Item 987654321/78157

Please use this identifier to cite or link to this item: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/78157

Title:	Test Slice Difference Technique for Low-Transition Test Data Compression
Authors:	饒建奇;吳柏翰;李威霖
Contributors:	淡江大學電機工程學系
Keywords:	Test Data Compression;Low Power Testing;VLSI;Design for Testability;DFT
Date:	2012-06-01
Issue Date:	2012-09-07 18:53:55 (UTC+8)
Publisher:	Taiwan : Tamkang University
Relation:	淡江理工學刊 = Tamkang Journal of Science and Engineering 15(2), pp.157-166
DOI:	10.6180/jase.2012.15.2.09
Appears in Collections:	[電機工程學系暨研究所] 期刊論文

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