This paper presents a low power strategy for test data compression and a new decompression
scheme for test vectors. In our method, we propose an efficient algorithm for scan chain reordering to deal with the power dissipation problem. Further, we also propose a test slice difference (TSD) technique to improve test data compression. It is an efficient method and only needs one extra scan cell. In experimental results, the scheme that we presented achieve high compression ratio. The power consumption is also better compared with other well-known compression techniques.
關聯:
淡江理工學刊 = Tamkang Journal of Science and Engineering 15(2), p.157-166
