Inference from lumen degradation data under Wiener diffusion process

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Title:	Inference from lumen degradation data under Wiener diffusion process
Authors:	Tsai, Tzong-ru;Lin, Chin-wei;Sung, Yi-ling;Chou, Pei-ting;Chen, Chiu-ling;Lio, Yuh-long
Contributors:	淡江大學統計學系
Keywords:	Degradation;Loading;Stress;Load modeling;Maximum likelihood estimation;Light emitting diodes;Reliability
Date:	2012-07-13
Issue Date:	2012-09-06 14:50:24 (UTC+8)
Publisher:	IEEE
Abstract:	The lumen degradation of light emitting diodes subject to increasing stress loading is investigated by using a cumulative damage model. The cumulative damage process is taken as a Wiener diffusion process with a drift which depends on two stress loadings. General statistical inferences on the parameters and percentiles of the light emitting diode lifetime distribution are presented based on the cumulative damage measurements, collected from a two-variable constant-stress loading accelerated degradation test. Approximate lower s-confidence bounds of the light emitting diode lighting lifetime percentiles are given using the Fisher information of the maximum-likelihood estimators, and Bonferroni's inequality. The application of the proposed method is illustrated by a lumen cumulative damage data set of high power light emitting diodes.
Relation:	IEEE Transactions on Reliability 61(3), p.710-718
DOI:	10.1109/TR.2012.2207533
Appears in Collections:	[Graduate Institute & Department of Statistics] Journal Article

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