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    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/78149

    题名: Inference from lumen degradation data under Wiener diffusion process
    作者: Tsai, Tzong-ru;Lin, Chin-wei;Sung, Yi-ling;Chou, Pei-ting;Chen, Chiu-ling;Lio, Yuh-long
    贡献者: 淡江大學統計學系
    关键词: Degradation;Loading;Stress;Load modeling;Maximum likelihood estimation;Light emitting diodes;Reliability
    日期: 2012-07-13
    上传时间: 2012-09-06 14:50:24 (UTC+8)
    出版者: IEEE
    摘要: The lumen degradation of light emitting diodes subject to increasing stress loading is investigated by using a cumulative damage model. The cumulative damage process is taken as a Wiener diffusion process with a drift which depends on two stress loadings. General statistical inferences on the parameters and percentiles of the light emitting diode lifetime distribution are presented based on the cumulative damage measurements, collected from a two-variable constant-stress loading accelerated degradation test. Approximate lower s-confidence bounds of the light emitting diode lighting lifetime percentiles are given using the Fisher information of the maximum-likelihood estimators, and Bonferroni's inequality. The application of the proposed method is illustrated by a lumen cumulative damage data set of high power light emitting diodes.
    關聯: IEEE Transactions on Reliability 61(3), p.710-718
    DOI: 10.1109/TR.2012.2207533
    显示于类别:[統計學系暨研究所] 期刊論文


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