English  |  正體中文  |  简体中文  |  全文笔数/总笔数 : 55025/89277 (62%)
造访人次 : 10606887      在线人数 : 21
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜寻范围 查询小技巧:
  • 您可在西文检索词汇前后加上"双引号",以获取较精准的检索结果
  • 若欲以作者姓名搜寻,建议至进阶搜寻限定作者字段,可获得较完整数据
  • 进阶搜寻


    jsp.display-item.identifier=請使用永久網址來引用或連結此文件: http://tkuir.lib.tku.edu.tw:8080/dspace/handle/987654321/78137


    题名: A Novel SOPC-Based CMOS Image Sensor Testing System
    作者: Li, Shin-an;Chiang, Jen-shiun;Chen, Kuang-yuan;Liu, Ta-kang;Wong, Ching-chang
    贡献者: 淡江大學電機工程學系
    关键词: EMBEDDED PROCESSOR;FPGA;HW/SW CO-DESIGN;IMAGE ACCELERATOR;IMAGE PROCESS;SOPC
    日期: 2012-05-01
    上传时间: 2012-09-04 13:56:01 (UTC+8)
    出版者: Valencia: American Scientific Publishers
    摘要: Since CMOS Image Sensor (CIS) has the characteristics of low cost and low power consumption as well as ease of integration with digital IC, the module size can thus be greatly reduced. Therefore, as the process evolutions, CMOS pixel capacity gets continuously enlarged, and it is thus wieldy used in all kinds of consumer products that need to record or detect the images. However, as the image quantity gets continuously enhanced, the test process of CIS gets more and more complicated, the needed test platform price and test time gets increased, which usually leads to serious burden on the test cost. The test procedure of CIS actually can be divided into traditional DC parameter test, functional test and the specific image test for CIS. However, the test platform associated the above two test functions hast is specific use, and the enhancement in the pixel capacity further leads to difficulty in reducing the test cost. This paper proposes a System On a Programmable Chip (SOPC) based CMOS image test platform to be associated with traditional function test platform to form a CIS test architecture. It not only can break the specific use of test platform, but also can reduce the test cost effectively. Moreover, due to the great reduction of image transmission distance, the image test quality can be greatly reduced.
    關聯: Sensor Letters 10(5-6), pp.1068-1074
    DOI: 10.1166/sl.2012.2287
    显示于类别:[電機工程學系暨研究所] 期刊論文

    文件中的档案:

    档案 描述 大小格式浏览次数
    index.html0KbHTML199检视/开启

    在機構典藏中所有的数据项都受到原著作权保护.

    TAIR相关文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回馈