English  |  正體中文  |  简体中文  |  全文筆數/總筆數 : 64178/96951 (66%)
造訪人次 : 9436113      線上人數 : 8865
RC Version 7.0 © Powered By DSPACE, MIT. Enhanced by NTU Library & TKU Library IR team.
搜尋範圍 查詢小技巧:
  • 您可在西文檢索詞彙前後加上"雙引號",以獲取較精準的檢索結果
  • 若欲以作者姓名搜尋,建議至進階搜尋限定作者欄位,可獲得較完整資料
  • 進階搜尋
    請使用永久網址來引用或連結此文件: https://tkuir.lib.tku.edu.tw/dspace/handle/987654321/77305


    題名: Risk Dynamics throughout the system development Life Cycle
    作者: Yu, Chia-lng;Chen, Houn-Gee;Klein, Gary;Jiang, James J.
    貢獻者: 淡江大學資訊管理學系
    關鍵詞: Risk management;System development life cycle;Project management;Socio-technical model
    日期: 2015-12-10
    上傳時間: 2012-06-18 15:10:12 (UTC+8)
    出版者: Stillwater: International Association for Computer Information Systems
    摘要: Risks must be controlled during the development of a new system in order to best promote success. However, resources that can be dedicated to controlling risks are often limited. To best design an effective and efficient portfolio of controls, it is important to understand if and how risks change during the course of a system development. Using a framework developed from socio-technical theories, we conduct a multiple case study to determine the pattern of risk dynamics through the stages of the development life cycle. Risks associated with structural concerns dominate and increase as the life cycle progress, while technology risks are not very common early, but become so later. Risks associated with tasks and actor are common and do not change much in incidence. The results indicate the value of the sociotechnical model in identifying risks and how control portfolios should change over the course of a system development.
    關聯: Journal of Computer Information Systems 53(3), p.28-37
    DOI: 10.1080/08874417.2013.11645629
    顯示於類別:[資訊管理學系暨研究所] 期刊論文

    文件中的檔案:

    檔案 描述 大小格式瀏覽次數
    index.html0KbHTML358檢視/開啟
    Risk Dynamics throughout the system development Life Cycle.pdf141KbAdobe PDF330檢視/開啟

    在機構典藏中所有的資料項目都受到原著作權保護.

    TAIR相關文章

    DSpace Software Copyright © 2002-2004  MIT &  Hewlett-Packard  /   Enhanced by   NTU Library & TKU Library IR teams. Copyright ©   - 回饋