Planning step-stress test plans under Type-I censoring for the log-location-scale case

機構典藏 > College of Sciences > Graduate Institute & Department of Mathematics > Journal Article > Item 987654321/77037

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Title:	Planning step-stress test plans under Type-I censoring for the log-location-scale case
Authors:	Lin, Chien-Tai;Chou, Cheng-Chieh;Balakrishnan, N.
Contributors:	淡江大學數學學系
Keywords:	accelerated life;reliability;censored data;distributed computations;Weibull and similar distributions;maximum likelihood;optimization
Date:	2012-03-01
Issue Date:	2012-05-24 11:05:37 (UTC+8)
Publisher:	Abingdon: Taylor & Francis
Abstract:	In this paper, we consider a k-level step-stress accelerated life-testing (ALT) experiment with unequal duration steps τ=(τ1, …, τ k ). Censoring is allowed only at the change-stress point in the final stage. A general log-location-scale lifetime distribution with mean life which is a linear function of stress, along with a cumulative exposure model, is considered as the working model. Under this model, the determination of the optimal choice of τ for both Weibull and lognormal distributions are addressed using the variance–optimality criterion. Numerical results show that for a general log-location-scale distributions, the optimal k-step-stress ALT model with unequal duration steps reduces just to a 2-level step-stress ALT model.
Relation:	Journal of Statistical Computation and Simulation 83(10), pp.1852-1867
DOI:	10.1080/00949655.2012.672573
Appears in Collections:	[Graduate Institute & Department of Mathematics] Journal Article

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